首页> 外文会议>The 9th World Multi-Conference on Systemics, Cybernetics and Informatics(WMSCI 2005) vol.9 >Low-noise NbN Phonon—cooled Hot-Electron Bolometer Mixers for Terahertz Heterodyne Receivers
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Low-noise NbN Phonon—cooled Hot-Electron Bolometer Mixers for Terahertz Heterodyne Receivers

机译:用于太赫兹外差接收器的低噪声NbN声子—冷却的热电子流量计混合器

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The mixers were fabricated from NbN film deposited on a high-resistivity Si substrate with a MgO buffer layer. The mixer element was integrated with a log-periodic spiral antenna. The noise temperature measurements were performed at 2.5 THz and at 3.8 THz local oscillator frequencies for the 3 × 0.2μm~a active area devices. The best uncorrected receiver noise temperatures found for these frequencies sure 1300 K and 3100 K, respectively. A water vapour discharge laser was used as the LO source. The gain bandwidth of the mixer based on 3.5 nm NbN film deposited on Si with MgO is 4.2 GHz and the noise bandwidth for the same device amounts to 5 GHz. The results of the research into decrease of the direct detection contribution to the measured Y-factor and a possible error of noise temperature calibration are presented. The use of a square nickel cell mesh as an IR-filter enabled us to avoid the effect of direct detection and measure apparent value of the noise temperature which was 16% less than that obtained using conventional black polyethylene IR-filter.
机译:混合器由沉积在具有MgO缓冲层的高电阻率Si基板上的NbN薄膜制成。混频器元件与对数周期螺旋天线集成在一起。对于3×0.2μm〜a有源区域器件,在2.5 THz和3.8 THz本地振荡器频率下进行噪声温度测量。对于这些频率,发现最佳的未校正接收机噪声温度分别为1300 K和3100K。水蒸气放电激光器用作LO源。基于沉积在具有MgO的Si上的3.5 nm NbN薄膜的混频器的增益带宽为4.2 GHz,同一器件的噪声带宽为5 GHz。提出了减少直接检测对被测Y因子的贡献以及噪声温度校准的可能误差的研究结果。使用方形镍电池网作为红外滤光片使我们避免了直接检测的影响,并测量了噪声温度的表观值,该值比使用常规黑色聚乙烯红外滤光片所获得的值低了16%。

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