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Gold: The High Reliability Choice in Semiconductor Packaging

机译:黄金:半导体封装中的高可靠性选择

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摘要

The reliability of gold in microelectronic packaging makes it the standard, by which all otherrnmaterials must be judged. Even though the price of gold has risen significantly in this decade the usage ofrngold in microelectronic packaging has continued to grow and as consumer demand for high-endrnelectronics continues to increase this trend looks set to continue.rnEfforts to make the most cost-effective usage of gold through spot plating, plating thicknessrnreduction and the usage of thinner bonding wire have been successful. Gold wire remains the main wirernmaterial for ball bonding in microelectronics assembly and has proven reliable in billions of devices overrnmany years. However, high gold prices are increasingly forcing a shift towards cheaper copper wire,rndespite concerns over reliability. As a result there is a need to obtain higher quality reliability data withrngold and copper wires supported by state of the art analytical methods. This will help quantify and validaternthe relative merits of the two metals in this critical application.rnDesign-for-recycling should also be an important consideration in material selection. Thernprecious metals (mainly gold) constitute a very substantial proportion of the material value of wasternelectronic and electrical equipment (WEEE) and gold can be considered as a key component of therneconomic viability of WEEE recycling.
机译:微电子包装中金的可靠性使其成为标准,必须根据该标准来判断所有其他材料。尽管在这十年中金价已经大幅上涨,但在微电子封装中对金的使用仍在继续增长,并且随着消费者对高端电子的需求持续增加,这种趋势似乎仍将继续。通过点镀金,减少镀层厚度和使用更细的焊线已取得成功。金线仍然是微电子组件中球焊的主要线材,并且在数十亿年的设备中已证明可靠。然而,尽管人们对可靠性感到担忧,但高昂的金价正迫使其转向更便宜的铜线。结果,需要使用由最新技术分析方法支持的金线和铜线来获得更高质量的可靠性数据。这将有助于量化和验证在此关键应用中两种金属的相对优点。回收设计也应是材料选择中的重要考虑因素。贵金属(主要是金)在电子和电气设备(WEEE)的材料价值中占非常重要的比例,金可被视为WEEE循环经济可行性的关键组成部分。

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