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Nanostructural image modelling for testing of EUV projective objective

机译:用于测试EUV投射物镜的纳米结构图像建模

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摘要

The two mirror Schwarzschild objective with NA=0.36 designed for an experimental EUV lithographer has been studied. Test measurements by computer isophotometry method have shown the capability of this objective to resolve the image features with a size of no more than 50 nm at wavelength of 13.4 nm.
机译:研究了为实验EUV光刻机设计的NA = 0.36的两面镜Schwarzschild物镜。通过计算机等光光度法进行的测试测量表明,该物镜具有分辨13.4 nm波长处尺寸不超过50 nm图像特征的能力。

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