首页> 外文会议>26th International Symposium for Testing and Failure Analysis, Nov 12-16, 2000, Bellevue, Washington >UV Reflectance Spectroscopy of the Copper/Copper Oxide System for Assessment of Solderability
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UV Reflectance Spectroscopy of the Copper/Copper Oxide System for Assessment of Solderability

机译:铜/铜氧化物体系的紫外反射光谱法,用于评估可焊性

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摘要

Surface changes of copper and copper coupons coated with organic solderability preservative (OSP) after accelerated aging were measured using UV Differential Reflectance Spectroscopy. A chemometric method has been developed that allows correlation of the spectroscopic results with independent measurements of the solderability of the copper and copper/OSP coupons using a wetting balance or sequential electrochemical reduction analysis (SERA). Based on the results of this study, a versatile instrument for the assessment of the solderability of printed wiring boards has been demonstrated. The instrument is currently in beta testing at several locations.
机译:使用紫外差反射光谱法测量加速老化后铜和涂有有机可焊性防腐剂(OSP)的铜试样的表面变化。已经开发出一种化学计量学方法,该方法允许使用润湿天平或顺序电化学还原分析(SERA)将光谱结果与铜和铜/ OSP试样的可焊性进行独立测量。基于这项研究的结果,已证明了一种用于评估印刷线路板可焊性的多功能仪器。该仪器目前正在多个位置进行Beta测试。

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