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Single Event Upset Detection and Correction in Virtex-4 and Virtex-5 FPGAs

机译:Virtex-4和Virtex-5 FPGA中的单事件翻转检测和校正

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摘要

A design for the detection and correction of single event upsets (SEUs) in the configuration memory of field programmable gate arrays (FPGAs) is presented. Larger configuration memories and shrinking design rules have caused concerns to rise about SEUs in high-reliability high-availability systems using FPGAs. We describe the operation and architecture of the proposed design as well as its implementation in Xilinx Virtex-4 and Virtex-5 FPGAs.
机译:提出了一种用于检测和校正现场可编程门阵列(FPGA)的配置存储器中的单事件翻转(SEU)的设计。较大的配置存储器和缩小的设计规则引起了人们对使用FPGA的高可靠性,高可用性系统中SEU的关注。我们描述了拟议设计的操作和架构,以及在Xilinx Virtex-4和Virtex-5 FPGA中的实现。

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