Accelerating Physical Verification Using STPRL: a Novel Language for Test Pattern Generation

摘要

In this work, test-patterns, test-cases and layout-patterns generations are widely investigated in the sense of turnaround time for creation and/or modification. STPRL, a novel behavioral modeling language for test-pattern creation, is being proposed. The turn-around time for both creation and modification is hugely reduced at no degradation in either accuracy or performance. Furthermore, STPRL provides considerable performance improvements in custom test-patterns creation over available automatic layout creation tools. Our method has been verified with real data at different node-technologies and for migration from and between different technology nodes.