THE ADHESION OF IRREGULARLY-SHAPED PARTICLES: EFFECTS OF VAN DER WAALS FORCES AND ELECTROSTATICALLY-CHARGED PATCHES

摘要

The size of the removal forces measured appear consistent with estimates that assume van der Waals interactions, but, in general, appear too large to be attributed to electrostatic interactions alone. As the concentration of silica approaches 2%, the contributions of the van der Waals and the electrostatic forces become comparable in magnitude.