Real-time analysis of semiconductor memories under the influence of ionizing radiation

摘要

This paper aims to analyze the influence of ionizing irradiation on various types of the semiconductor memories by means of the FPGA circuit logic. The reason for such tests is to determine the durability of digital electronics in the biomedicine, e.g. in pacemakers, during the radiotherapy. Static RAM EPROM and EEPROM memories were tested, which were tested, which were placed on a gamma-exposed test pad. As a source of the ionizing radiation, the TERAGAM irradiator and The Cyber Knife radio surgical instrument with a linear accelerator were used. The Memory Testing Controller is built on the FPGA chip that tests all the connected memories in parallel, and stores the detailed results in the event log.