首页> 外国专利> Production of a semiconductor radiation detector for detecting electromagnetic radiation and ionized particulate radiation comprises applying at least one semiconductor layer on at least one main surface by epitaxial growth

Production of a semiconductor radiation detector for detecting electromagnetic radiation and ionized particulate radiation comprises applying at least one semiconductor layer on at least one main surface by epitaxial growth

机译:用于检测电磁辐射和离子化微粒辐射的半导体辐射检测器的生产包括通过外延生长在至少一个主表面上施加至少一个半导体层

摘要

Production of a semiconductor radiation detector comprises applying at least one semiconductor layer on at least one main surface by epitaxial growth. An independent claim is also included for a semiconductor radiation detector produced by the above process.
机译:半导体辐射检测器的制造包括通过外延生长在至少一个主表面上施加至少一个半导体层。通过上述方法制造的半导体辐射探测器还包括独立权利要求。

著录项

  • 公开/公告号DE10308626A1

    专利类型

  • 公开/公告日2004-12-02

    原文格式PDF

  • 申请/专利权人 KEMMER JOSEF;

    申请/专利号DE20031008626

  • 发明设计人 KEMMER JOSEF;

    申请日2003-02-27

  • 分类号H01L31/18;H01L31/10;H01L27/144;

  • 国家 DE

  • 入库时间 2022-08-21 22:01:31

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