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Design considerations for optimization of pull-in stability margin in electrostatic N/MEM relays

机译:优化静电N / MEM继电器的插入稳定裕度的设计注意事项

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This study aims at providing guidelines for designing electrostatically-actuated microanoelectromechanical relays with a broad operating margin around the supply voltage V. Whereas it is tempting to focus mainly on minimizing the first pull-in voltage (V) in order to enable a low V, special attention should be paid to the so-called catastrophic pull-in (V), which corresponds to the movable electrode collapsing onto the actuating electrode for a sufficiently large overdrive. Based on analytical and finite element analysis (FEA) modeling, we study the dependence of a functionality margin defined as (V-V) versus the size and position of the actuating electrode with respect to the movable structure.
机译:这项研究旨在为设计在电源电压V周围具有宽工作裕度的静电驱动微/纳米机电继电器提供指导。然而,试图将主要拉入电压(V)降低到最小是很有吸引力的。 V,应特别注意所谓的灾难性吸合(V),它对应于可移动电极塌陷在致动电极上,以产生足够大的超速行驶。基于分析和有限元分析(FEA)建模,我们研究了定义为(V-V)的功能裕度与致动电极相对于可移动结构的大小和位置的相关性。

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