Fraunhofer Inst. for Microelectron. Circuits Syst.(IMS),47057 Duisburg, Germany;
Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), 47057 Duisburg, Germany;
Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), 47057 Duisburg, Germany;
Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), 47057 Duisburg, Germany;
Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), 47057 Duisburg, Germany;
Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), 47057 Duisburg, Germany;
Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), 47057 Duisburg, Germany;
Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), 47057 Duisburg, Germany;
Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), 47057 Duisburg, Germany;
Transistors; Logic gates; Standards; Quantization (signal); CMOS technology; Resistors; Monte Carlo methods;
机译:使用闪存进行集成电路验证的物理上无法克隆的功能的研究
机译:增强使用混沌电路的物理上不可分类功能安全的框架
机译:使用差分放大器实现物理不可克隆功能的集成电路设计
机译:实现基于晶体管的物理不可渗透功能的集成差分读出电路
机译:物理上不可克隆的功能的设计和实现技术。
机译:基于SRAM物理上不可克隆的功能的移动设备上的受信任相机
机译:物理上不可克隆的功能的设计和实现技术