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Advance technique for automatic optical inspection process optimization

机译:自动光学检查过程优化的先进技术

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摘要

Customers complain has been received due to defect found at their field specifically the Scratches and Bump Defects. Ironically, defect found at their end should not be reaching since there is an AOI Process at WLCSP. Every complaint has been documented through EFAR and validated one by one.
机译:客户抱怨由于在他们的领域发现的缺陷,特别是划痕和凹凸缺陷而收到了投诉。具有讽刺意味的是,由于WLCSP上有一个AOI流程,因此不应消除在末端发现的缺陷。每个投诉都已通过EFAR记录下来,并逐一验证。

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