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Advance technique for automatic optical inspection process optimization

机译:自动光学检测过程优化的推进技术

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Customers complain has been received due to defect found at their field specifically the Scratches and Bump Defects. Ironically, defect found at their end should not be reaching since there is an AOI Process at WLCSP. Every complaint has been documented through EFAR and validated one by one.
机译:由于在他们的领域发现的缺陷,客户抱怨已经收到了薄刮和撞击缺陷。具有讽刺意味的是,由于WLCSP的AOI工艺,因此,在其最终中发现的缺陷不应达到。每次投诉都通过EFAR记录并逐一验证。

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