Structural Go/No-Go test of the TD-ADC for catastrophic faults

摘要

Nowadays, Analog to Digital Converter (ADC) has become the main block of mixed signal circuits. Hence, testing ADC circuits is of great interest. In this paper, a low cost structural test is developed for the Time Domain ADC (TD-ADC). The TD-ADC consists of a Voltage-to-Time Converter (VTC) and a Vernier Time-to-Digital Converter (Vernier TDC). The circuit under test is used in high energy physics, spectroscopy, medical imaging, radiation sensors, and environmental sensors. It is shown that only two test values are required to detect 98.1% of catastrophic faults in the fault set. The LTSpice simulator on 45nm CMOS model provided from MOSIS was used in the analysis.