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QFN challenges: Second bond improvement to eliminate the weak stitch (fish tail) failure mechanism on pre plated lead frame

机译:QFN挑战:改进第二次键合以消除预镀引线框架上的弱针迹(鱼尾)失效机制

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Most of the device's technology has been moving towards the complex and produce of Nano-IC with demands for cheaper cost, smaller size and better thermal and electrical performance. One of the marketable packages is Quad Flat No-Lead (QFN) package. Due to the high demand of miniaturization of electronic products, QFN development becomes more promising, such as the lead frame design with half edge, cheaper tape, shrinkage of package size as to achieve more units per lead frame (cost saving) and etc [1]. The improvement methods in the lead frame design, such as lead frame metal tie bar and half edge features are always the main challenges for QFN package. With reduced the size of metal tie bar, it will fasten the package singulation process, whereas the half edge is designed for the mold compound locking for delamination reduction purpose. This paper specifically will discuss how the critical wire bonding parameters, capillary design and environmental conditions interact each other result to the unstable leads (second bond failures). During the initial evaluation of new package SOT1261 with rough PPF lead frame, several short tails and fish tails observed on wedge bond when applied with the current parameter setting which have been qualified in other packages with same wire size (18um Au wire). These problems did not surface out in earlier qualified devices mainly due to the second bond parameter robustness, capillary designs, lead frame design changes, different die packages, lead frame batches and contamination levels. One of the main root cause been studied is the second bond parameter setting which is not robust enough for the flimsy lead frame. The new bonding methodology, with the concept of low base ultrasonic and high force setting applied together with scrubbing mechanism to eliminate the fish tail bond and also reduce short tail occurrence on wedge. Wire bond parameters optimized to achieve zero fish tail, and wedge pull reading with >4.0gf. Destructive test such as wedge pull test used to test the bonding quality. Failure modes are analyzed using high power optical scope microscope and Scanning Electronic Microscope (SEM). By looking through into all possible root causes, and identifying how the factors are interacting, some efforts on the Design of Experiments (DOE) are carried out and good solutions were implemented.
机译:该器件的大多数技术已朝着纳米IC的复杂化和生产化方向发展,以要求更便宜的成本,更小的尺寸以及更好的热和电性能。一种可销售的封装是四方扁平无引线(QFN)封装。由于对电子产品的小型化的高要求,QFN的发展变得更加有前途,例如具有半边的引线框架设计,更便宜的胶带,缩小的封装尺寸以实现每个引线框架更多的单位(节省成本)等[1]。 ]。引线框架设计中的改进方法,例如引线框架金属拉杆和半边特征,一直是QFN封装面临的主要挑战。随着金属拉杆尺寸的减小,它将加快封装的分离过程,而半边设计用于模塑料锁定,以减少分层。本文将专门讨论关键的引线键合参数,毛细管设计和环境条件如何相互影响,从而导致不稳定的引线(第二键合失败)。在初步评估具有粗糙PPF引线框架的新封装SOT1261时,在应用当前参数设置的情况下,在楔形键合上观察到了一些短尾巴和鱼尾,这些短尾巴和鱼尾巴已经在其他具有相同线径(18um金线)的封装中得到认可。这些问题并未在较早合格的设备中浮出水面,这主要是由于第二键合参数的稳健性,毛细管设计,引线框架设计的变化,不同的芯片封装,引线框架批次和污染水平。研究的主要原因之一是第二键合参数设置,该设置对于脆弱的引线框架而言不够鲁棒。新的粘合方法结合了低基超声波和高力设定的概念以及擦洗机制,消除了鱼尾键,并减少了楔形物上短尾的出现。线键合参数经过优化,以实现零鱼尾和楔形拉力读数> 4.0gf。破坏性测试(例如楔形拉力测试)用于测试粘合质量。使用高功率光学显微镜和扫描电子显微镜(SEM)分析故障模式。通过调查所有可能的根本原因,并确定因素之间的相互作用,对实验设计(DOE)进行了一些努力,并实施了良好的解决方案。

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