Department of Applied Physics, Waseda University, Japan;
National Institute of Advanced Industrial Science and Technology (AIST), Japan;
National Institute of Advanced Industrial Science and Technology (AIST), Japan;
Department of Applied Physics, Waseda University, Japan;
Department of Applied Physics, Waseda University, Japan;
Department of Applied Physics, Waseda University, Japan;
Temperature measurement; Compounds; Physics; Optical switches; Probes; Semiconductor device measurement; Time measurement;
机译:In_(0.8)Ga_(0.2)As / AlAs / AlAs _(0.56)Sb_(0.44)耦合双量子阱中的皮秒载流子自旋弛豫
机译:耦合双量子阱结构中由于电子相互作用引起的载流子弛豫-art。没有。 045325
机译:未掺杂的GaAs双量子阱中的载流子自旋弛豫
机译:PicoSeconds载体旋转松弛在In0.8ga0.2as / Al0.5ga0.5as / alas0.56sb0.44耦合双量子孔中
机译:单层和少层石墨烯自旋阀的制造和表征导致自旋弛豫长度以及自旋电压对载流子浓度的依赖性得到优化。
机译:超快载体弛豫动态在量子限制非各向同性硅纳米结构由电感耦合等离子体工艺合成
机译:耦合电子 - 电子相互作用引起的载流子弛豫 双量子阱结构
机译:Gaas-al(x)Ga(1-x)量子阱中载流子自旋弛豫的飞秒谱