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ARO-PUF: An aging-resistant ring oscillator PUF design

机译:ARO-PUF:抗老化环形振荡器PUF设计

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Physically Unclonable Functions (PUFs) have emerged as a security block with the potential to generate chip-specific identifiers and cryptographic keys. However it has been shown that the stability of these identifiers and keys is heavily impacted by aging and environmental variations. Previous techniques have mostly focused on improving PUF robustness against supply noise and temperature but aging has been largely neglected. In this paper, we propose a new aging resistant design for the popular ring-oscillator (RO)-PUF. Simulation results demonstrate that our aging resistant RO-PUF (called ARO-PUF) can produce unique, random, and more reliable keys. Only 7.7% bits get flipped on average over 10 years operation period for an ARO-PUF due to aging where the value is 32% for a conventional RO-PUF. The ARO-PUF shows an average interchip HD of 49.67% (close to ideal value 50%) and better than the conventional RO-PUF (∼45%). With lower error, ARO-PUF offers ∼ 24X area reduction for a 128-bit key because of reduced ECC complexity and smaller PUF footprint.
机译:物理上不可克隆的功能(PUF)已作为一种安全模块出现,它有可能生成特定于芯片的标识符和加密密钥。然而,已经表明,这些标识符和密钥的稳定性受到老化和环境变化的严重影响。先前的技术主要集中在提高PUF抵抗电源噪声和温度的鲁棒性,但老化已被大大忽略。在本文中,我们为流行的环形振荡器(RO)-PUF提出了一种新的抗老化设计。仿真结果表明,我们的抗老化RO-PUF(称为ARO-PUF)可以生成唯一,随机且更可靠的密钥。由于老化,ARO-PUF在10年的运行期间内平均仅翻转7.7%的比特,而传统RO-PUF的比特值为32%。 ARO-PUF显示平均芯片间HD为49.67%(接近理想值50%),并且优于常规RO-PUF(〜45%)。由于降低了ECC复杂度并减小了PUF占用空间,因此ARO-PUF的错误率较低,可将128位密钥的面积减少约24倍。

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