Nat. Cheng Kung Univ., Tainan, Taiwan;
ball grid arrays; creep; finite element analysis; integrated circuit interconnections; integrated circuit modelling; integrated circuit reliability; silver; solders; viscoplasticity; wafer level packaging; BGA layout; FE analysis; WLP; ball grid array; board-level T-C reliability test; board-level temperature cycling reliability; constant strain rate experiments; damage accumulation; finite element analysis; inelastic strain energy density accumulation; interconnect fatigue failure model; lead-free solder; package ge;
机译:晶圆级芯片级封装的板级跌落可靠性的结构设计优化
机译:晶圆级芯片级封装的板级跌落可靠性研究
机译:晶圆级芯片级封装的板级跌落可靠性研究
机译:板级温度循环下晶圆水平包装的定量可靠性预测模型
机译:电子封装互连的板级可靠性的快速预测
机译:晶圆级底部填充对热循环测试过程中超薄芯片堆叠式3D-IC组件微凸点可靠性的影响
机译:无铅区域阵列封装与各种可返工的聚合物增强材料的板级互连可靠性