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A 28nm 6T SRAM memory compiler with a variation tolerant replica circuit

机译:具有变化容限复制电路的28nm 6T SRAM存储器编译器

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We propose an SRAM replica tracking circuit that reduces divergence of the replica path relative to normal read path (6–16% less Sense differential Requirement), thus improving the access time by 5–8%. The approach is compatible to power managed SRAMs having Retain till Access feature and also for non power managed SRAMs with no sense differential impact. Using This Replica tracing circuit Sense differential has been well tracked across all array and periphery voltages combinations which further improve the access time by 4–6%. Instances with this method 0.5–256Kb have been tested on a 28nm CMOS LP process.
机译:我们提出了一种SRAM副本跟踪电路,该电路可相对于正常读取路径减少副本路径的发散(感测差分要求降低6–16%),从而将访问时间缩短5–8%。该方法与具有“保留直到访问”功能的电源管理SRAM兼容,也与无感官差异影响的非电源管理SRAM兼容。使用此副本跟踪电路,可以在所有阵列和外围电压组合上很好地跟踪Sense差分,从而将访问时间进一步缩短了4–6%。使用这种方法的实例0.5–256Kb已在28nm CMOS LP工艺上进行了测试。

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