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Spatially resolved measurement of free-carrier absorption in silicon waveguides

机译：硅波导中自由载流子吸收的空间分辨测量

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摘要

Spatially resolved measurement of free-carrier absorption in silicon nanophotonic waveguides using optical frequency-domain reflectometry is reported. Our measurement technique yields the local attenuation that is added by a strong continous-wave pump laser.

机译：报道了使用光频域反射法对硅纳米光子波导中的自由载流子吸收进行空间分辨的测量。我们的测量技术会产生由强大的连续波泵浦激光器增加的局部衰减。

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《2012 IEEE 9th International Conference on Group IV Photonics. 》|2012年|p.33- 35|共3页
会议地点 San Diego CA(US)
作者
Muller Jost; Huster Jens; Krause Michael; Renner Hagen; Brinkmeyer Ernst;
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作者单位

Technische Universität Hamburg-Harburg, E-11 Optische Kommunikationstechnik, Eißendorfer Straße 40, D-21073, Germany;

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原文格式 PDF
正文语种 eng
中图分类材料 ;
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Spatially resolved measurement of free-carrier absorption in silicon waveguides

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