首页> 外文会议>2012 10th IEEE/IAS International Conference on Industry Applications. >Interferometric measurements of nanometric displacements in a Piezoelectric Flextensional Actuator by using the new J1#x2026;J5 method
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Interferometric measurements of nanometric displacements in a Piezoelectric Flextensional Actuator by using the new J1#x2026;J5 method

机译:使用新的J1…J5方法干涉测量压电挠性执行器中的纳米位移

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In this work, nanometric displacement amplitudes of a Piezoelectric Flextensional Actuator (PFA) designed using the topology optimization technique and operating in its linear range are measured by using a homodyne Michelson interferometer. A new improved version of the J1…J4 method for optical phase measurements, named J1…J5 method, is presented, which is of easier implementation than the original one. This is a passive phase detection scheme, unaffected by signal fading, source instabilities and changes in visibility. Experimental results using this improvement were compared with those obtained by using the J1…J4, J1…J6(pos) and J1…J6(neg) methods, concluding that the dynamic range is increased while maintaining the sensitivity. Analysis based on the 1/f voltage noise and random fading show the new method is more stable to phase drift than all those methods.
机译:在这项工作中,使用零差迈克尔逊干涉仪测量了使用拓扑优化技术设计并在其线性范围内工作的压电挠性执行器(PFA)的纳米位移幅度。用于光学相位测量的J 1 …J 4 方法的新改进版本,名为J 1 …J 5 提出了一种方法,该方法比原始方法更易于实现。这是一种无源相位检测方案,不受信号衰落,源不稳定性和可见度变化的影响。将使用这种改进的实验结果与使用J 1 …J 4 ,J 1 …J 6所获得的结果进行比较inf>(pos)和J 1 …J 6 (neg)方法,得出的结论是在保持灵敏度的同时增加了动态范围。基于1 / f电压噪声和随机衰落的分析表明,与所有这些方法相比,该新方法对相位漂移的稳定性更高。

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