首页> 外文会议>2011 International Conference on Multimedia, Signal Processing and Communication Technologies >Design of low noise Amplifier using 90nm gate underlap SOI MOSFET for millimeter wave applications
【24h】

Design of low noise Amplifier using 90nm gate underlap SOI MOSFET for millimeter wave applications

机译:使用90nm栅极下重叠SOI MOSFET的低噪声放大器设计,用于毫米波应用

获取原文
获取原文并翻译 | 示例

摘要

This paper presents the significance of optimization of gate - source/drain extension region engineering (also known as under lap design) in 90nm Silicon - on -Insulator (SOI) MOSFET to improve the performance of a low noise Amplifier (LNA) for millimeter wave (mm-w) applications. A small signal model of underlap SOI MOSFET (with an optimized value of spacer- to- straggle ratio (s/σ) = 3.2 and doping gradient d 5nm/decade) has been developed and implemented in circuit simulator. Based on new Figure - of- Merit (FoM) involving voltage gain AV, unity gain frequency ƒT, forward gain S21, noise figure NF and dc power consumption PDC, the paper describes the significance of nano-scale SOI underlap design as compared to conventional (non underlap) design. The LNA designed using underlap exhibits nearly 10 dB gain, 4.1 dB NF and 13 mW power consumption in the frequency range from 15–20 GHz, which is suitable for M-Sequence ultra wideband Radar used in automotive vehicle.
机译:本文介绍了优化90nm绝缘体上硅(SOI)MOSFET的栅极-源极/漏极扩展区工程(也称为重叠设计)的意义,以改善毫米波低噪声放大器(LNA)的性能(mm-w)应用。已开发出并在电路仿真器中实现了一个小叠层SOI MOSFET的小信号模型(优化的隔离物对跨步比(s /σ)= 3.2,掺杂梯度d 5nm /十倍)。基于涉及电压增益A V ,单位增益频率ƒ T ,正向增益S 21 的新品质因数(FoM)图NF和直流功耗P DC ,说明了纳米级SOI叠底设计与常规(非叠底)设计相比的重要性。使用下叠叠层设计的LNA在15–20 GHz的频率范围内具有近10 dB的增益,4.1 dB的NF和13 mW的功耗,适用于汽车中使用的M序列超宽带雷达。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号