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Mechanical properties study of lead free solder joint material used in semiconductor packaging subjected to thermal condition

机译:热条件下用于半导体封装的无铅焊点材料的力学性能研究

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The effect of high temperature storage (HTS) on lead free solder joint material for ball grid array application using pull test method were studied in this paper. Some statistical analysis base on the pull test data also discussed. Three samples of different lead free solder joint material were selected in this experiment namely Sn3.8Ag0.7Cu (SAC387), Sn2.3Ag0.08Ni0.01Co (SANC), and Sn3.5Ag. After the thermal condition test, all the lead free solder joint material samples were tested using Dage 4000 pull test machine. Each pull test will be 5 units and each unit contain 8 balls. From all the samples, result shows that the mean pull strength for high temperature storage are 2847.66g, 2628.20g and 2613.79g for Sn3.5Ag, SANC and SAC387 respectively. Thus Sn3.5Ag shows a significantly better solder joint performance in terms of joint strength compare to SANC and SAC387. Hence, intermetallic compound (IMC) thicknesses were measured after cross-sectioning. Sample size for cross-sectioning was 3 units per read point, 2 balls per unit, and 3 maximum IMC peaks per ball and the measurement using high power scope of 100× and Image Analyzer software to measure the IMC thickness. For high temperature storage, result show that the mean IMC thicknesses for SAC387, SANC and Sn3.5Ag are 3.9139μm, 2.3111 μm and 2.3931 μm. It was found that IMC thickness for SANC and Sn3.5Ag does not show significant growth after high temperature storage but SAC387 demonstrated significant growth. Lower intermetallic thickness implies less brittle joint effect, thus from this part of study, better joint reliability is expected for the Sn3.5Ag solder system. In summary pull test method is feasible to be used in characterization in terms of solder joint strength of lead free solder joint material for semiconductor packaging. It also determined ball pull test results provide correlation of the IMC thickness and solder joint strength material.
机译:利用拉力试验方法研究了高温贮藏对球栅阵列应用无铅焊点材料的影响。还讨论了一些基于拉力测试数据的统计分析。在本实验中,选择了三种不同无铅焊点材料的样品,分别是Sn3.8Ag0.7Cu(SAC387),Sn2.3Ag0.08Ni0.01Co(SANC)和Sn3.5Ag。热条件测试后,使用Dage 4000拉力试验机测试所有无铅焊点材料样品。每个拉力测试将为5个单位,每个单位包含8个球。从所有样品中,结果表明,Sn3.5Ag,SANC和SAC387的高温储存平均拉力分别为2847.66g,2628.20g和2613.79g。因此,与接头强度和SAC387相比,Sn3.5Ag在接头强度方面显示出明显更好的焊接性能。因此,在横截面之后测量金属间化合物(IMC)的厚度。横截面的样品大小为每个读取点3个单位,每个单位2个球,每个球3个最大IMC峰,并使用100倍的高倍示波器和Image Analyzer软件进行测量以测量IMC厚度。对于高温存储,结果表明,SAC387,SANC和Sn3.5Ag的平均IMC厚度分别为3.9139μm,2.3111μm和2.3931μm。发现在高温存储后,SANC和Sn3.5Ag的IMC厚度没有显示出明显的增长,但SAC387显示出明显的增长。较低的金属间厚度意味着较弱的接头效应,因此,从这一部分的研究中,可以预期Sn3.5Ag焊料系统的接头可靠性更高。总之,就半导体封装用无铅焊点材料的焊点强度而言,拉力测试方法可用于表征。它还确定了球拉力测试结果,从而提供了IMC厚度和焊点强度材料的相关性。

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