首页> 外文会议>2010 27th International Conference on Microelectronics Proceedings >Electrical properties of Au/C60-Si photodiode structures with pristine and dithioloctane-functionalized C60 nanolayers
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Electrical properties of Au/C60-Si photodiode structures with pristine and dithioloctane-functionalized C60 nanolayers

机译:具有原始和二硫辛烷官能化的C 60 纳米层的Au / C 60 / n-Si光电二极管结构的电学性质

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The dithioloctane-treatment of C60 film was shown to ensure the deposition on it of gold nanoparticles with the controlled size and shape leading to enhancement of the Au/C60-Si structure photocurrent due to the excitation of local plasmons in metal nanoparticles. In this work the detailed investigation of the electrical properties of these structures with the pristine and dithioloctane-treated C60 interlayers was made. The current-voltage and capacitance-voltage dependencies were measured in the temperature range from 80 to 320 K. The mechanisms of the current flow and their parameters were determined. It was shown, that the used of dithioloctane-treatment of C60 layer did not change the mechanisms of the in current flow in Au/C60-Si structure, specifically, in a decrease of the series resistance, determined by C60 layer, and in a decrease of the effective height of barrier for the reverse current flow.
机译:研究表明,C 60 薄膜的二硫辛烷处理可确保金纳米颗粒在其上的沉积,尺寸和形状可控,从而提高了Au / C 60 / n -Si结构光电流归因于金属纳米粒子中局部等离子体激元的激发。在这项工作中,对原始结构和二硫辛烷处理过的C 60 中间层的这些结构的电性能进行了详细的研究。在80至320 K的温度范围内测量了电流-电压和电容-电压依赖性。确定了电流的机理及其参数。结果表明,采用二硫辛烷处理C 60 层不会改变Au / C 60 / n-Si结构中电流的流动机理,具体而言,由C 60 层确定的串联电阻的减小和反向电流流动的势垒有效高度的减小。

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