首页> 外文会议>2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems >Use of prognostics in risk-based decision making for BGAs under shock and vibration loads
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Use of prognostics in risk-based decision making for BGAs under shock and vibration loads

机译:在冲击和振动负载下,基于预测的风险对BGA的决策

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Leading indicators of failure have been developed based on high-frequency characteristics, and system-transfer function derived from resistance spectroscopy measurements during shock and vibration. The technique is intended for condition monitoring in high reliability applications where the knowledge of impending failure is critical and the risks in terms of loss-of-functionality are too high to bear. Previously, resistance spectroscopy measurements [Constable 1992, Lizzul 1994, Prassana 1995] have been used during thermal cycling tests to monitor damage progression due to thermo-mechanical stresses. The development of resistance spectroscopy based damage pre-cursors for prognostication under shock and vibration is new. In this paper, the high-frequency characteristics, and system transfer function based on resistance spectroscopy measurements have been correlated with the damage progression in electronics during shock and vibration. Packages being examined include ceramic area-array packages. Second level interconnect technologies examined include copper-reinforced solder column, SAC305 solder ball, and 90Pb10Sn high-lead solder ball. Assemblies have been subjected to 1500g, 0.5 ms pulse [JESD-B2111]. Continuity has been monitored in-situ during the shock test for identification of part-failure. Resistance spectroscopy based damage pre-cursors have been correlated with the optically measured transient strain based feature vectors. High speed cameras have been used to capture the transient strain histories during shock-impact. Statistical pattern recognition techniques have been used to identify damage initiation and progression and determine the statistical significance in variance between healthy and damaged assemblies. Models for healthy and damaged packages have been developed based on package characteristics. Data presented shows that high-frequency characteristics and system-transfer characteristics based on resistance spectroscopy measurements can be used for-n-n condition-monitoring, damage initiation and progression in electronic systems. A positive prognostic distance has been demonstrated for each of the interconnect technologies tested.
机译:已基于高频特性开发了故障的领先指标,并且从冲击和振动过程中的电阻光谱测量中得出了系统传递函数。该技术旨在用于高可靠性应用中的状态监视,在这些应用中,即将发生故障的知识至关重要,而功能丧失方面的风险过高。以前,在热循环测试过程中使用电阻光谱测量[Constable 1992,Lizzul 1994,Prassana 1995]来监测由于热机械应力而引起的损伤进展。基于电阻光谱的损伤前体在冲击和振动下的预后发展是新的。在本文中,基于电阻光谱测量的高频特性和系统传递函数已经与电子产品在冲击和振动过程中的损坏进展相关。被检查的包装包括陶瓷面阵包装。研究的二级互连技术包括铜增强焊锡柱,SAC305焊球和90Pb10Sn高铅焊球。组件经受了1500g,0.5 ms的脉冲[JESD-B2111]。在冲击测试过程中对通断性进行了现场监测,以识别零件故障。基于电阻光谱的损伤前体已与光学测量的基于瞬态应变的特征向量相关联。高速摄像机已用于捕获冲击过程中的瞬态应变历史。统计模式识别技术已用于识别损坏的发生和发展,并确定健康组件与损坏组件之间的差异的统计显着性。根据包装的特性,开发了健康包装和损坏包装的模型。所提供的数据表明,基于电阻光谱测量的高频特性和系统传递特性可用于电子系统中的n-n状态监视,损伤引发和进展。已针对每种测试的互连技术证明了正的预后距离。

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