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Theoretical analyses on the shear test

机译:剪切试验的理论分析

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In board manufacturing the shear test is frequently used to evaluate the quality of the solder joints shortly after the soldering process as well as after thermal cycling. The latter evaluation is in particular applied to leadless ceramic components; a certain load drop is linked to solder degradation in a certain region of the joint which is declared “failed” if the load drop of the shear force reaches a predefined limit. However, there are many uncertainties in this evaluation like component misalignment to the shear tool, excessive voiding of the joint or by a fracture mode away from solder bulk failure. As few is known about these effects from a theoretical viewpoint, FE-studies have been performed to close this gap The analyses comprise studies of size effects, misalignment, and voiding on the shear force response. Additionally, the simulated solder creep response was compared to the measured one to check for the validity of creep laws for SAC solder. For a realistic creep rate range reached in low cycle fatigue, very low shear velocities have to be applied to the joints. A new shear tester was designed with shear velocities down to 1 nm/s to reach this goal.
机译:在电路板制造中,剪切测试通常用于在焊接过程之后以及热循环之后不久评估焊点的质量。后者的评估尤其适用于无铅陶瓷组件。如果剪切力的负载下降达到预定义的极限,则一定的负载下降与焊点在特定区域的降解有关,这被宣布为“失败”。但是,此评估中存在许多不确定性,例如与剪切工具的组件未对准,接头的过度空洞或由于远离焊料堆积故障的断裂模式。从理论的角度对这些影响知之甚少,因此已经进行了有限元研究来缩小这一差距。分析包括对剪切力响应的尺寸效应,未对准和空隙的研究。此外,将模拟的焊料蠕变响应与测得的蠕变响应进行比较,以检查SAC焊料蠕变定律的有效性。对于在低周疲劳中达到的实际蠕变速率范围,必须将非常低的剪切速度应用于接头。设计了一种新的剪切测试仪,其剪切速度低至1 nm / s以实现此目标。

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