首页> 外文会议>2006 7th International Conference on Electronics Packaging Technology(ICEPT 2006) >Simulation Study on Failure Factors of Pressure Sensor's Bond Wire
【24h】

Simulation Study on Failure Factors of Pressure Sensor's Bond Wire

机译:压力传感器焊线失效因素的仿真研究

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

With the development of automobile technology, more and more sensors are used for control of brakes, suspensions, engines, etc. To work well under harsh condition such as high temperature, power cycling, and rapid vibration, a sensor must have high reliability and durability, which is a great challenge to original equipment manufacturers (OEMs) and suppliers. It has been found that some bond aluminum-silicon wires in some pressure sensors were broken after vibration test with the 20g acceleration. Many factors have an effect on the sensor's reliability, for example, solder-lead materials, sensor structure and so on, however, wire bonding process was a key issue in sensors' IC package. In this paper, we take into account various parameters of bond wire such as the diameter and height of bond-wire, the span of the bond wire between two bond pads, and the thickness of squashed bond pad. A simplified model is established by reasonably simplifying some components' geometry property and boundary conditions. The simulation results show that sensor's reliability is high enough when suitable parameters of bond wire are selected, which provide a feasible method to improve the robustness of the process.
机译:随着汽车技术的发展,越来越多的传感器用于控制制动器,悬架,发动机等。要在高温,动力循环和快速振动等恶劣条件下正常工作,传感器必须具有高可靠性和耐用性对于原始设备制造商(OEM)和供应商而言,这是一个巨大的挑战。已经发现,在以20g加速度进行振动测试后,一些压力传感器中的某些铝硅线已断裂。许多因素都会影响传感器的可靠性,例如焊锡引线材料,传感器结构等,但是,引线键合工艺是传感器IC封装中的关键问题。在本文中,我们考虑了键合线的各种参数,例如键合线的直径和高度,两个键合垫之间的键合线的跨度以及压紧的键合垫的厚度。通过合理简化某些零部件的几何特性和边界条件,可以建立一个简化的模型。仿真结果表明,在选择合适的键合线参数后,传感器的可靠性已经足够高,这为提高工艺的鲁棒性提供了一种可行的方法。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号