首页> 外文会议>2005 NSTI Nanotechnology Conference and Trade Show(NSTI Nanotech 2005) vol.2 >Growth of 3C-SiC nanowires on nickel coated Si(100) substrate using dichloromethylvinylsilane and diethylmethylsilane by MOCVD method
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Growth of 3C-SiC nanowires on nickel coated Si(100) substrate using dichloromethylvinylsilane and diethylmethylsilane by MOCVD method

机译:使用二氯甲基乙烯基硅烷和二乙基甲基硅烷通过MOCVD法在镀镍Si(100)衬底上生长3C-SiC纳米线

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We have grown 3C-SiC nanowires on nickel coated Si(100) substrates using single source precursors by thermal metal-organic chemical vapor deposition (MOCVD) method. Dichloromethylvinylsilane (CH_2CHSi(CH_3)Cl_2) and diethylmethylsilane (CH_3SiH(C_2H_5)_2) were used as a single precursor without any carrier and bubbler gas. 3C-SiC nanowires with 40 ~ 100 nm diameter could grow on substrates at temperature as low as 900℃. XRD pattern showed that SiC nanowires were cubic silicon carbide. TEM analysis showed that an amorphous carbon layer surrounds the as-deposited SiC nanowires, and the 3C-SiC nanowire has [111] growth direction with well-crystallized structure. XPS and EDX analyses showed that the as-obtained SiC nanowire has an atomic Si and C composition of about 1.0:1.2, suggesting possible applications for both electronic devices and field emitters.
机译:我们已经通过热金属有机化学气相沉积(MOCVD)方法使用单源前体在镀镍Si(100)衬底上生长了3C-SiC纳米线。二氯甲基乙烯基硅烷(CH_2CHSi(CH_3)Cl_2)和二乙基甲基硅烷(CH_3SiH(C_2H_5)_2)被用作单一前体,没有任何载气和鼓泡气体。直径为40〜100 nm的3C-SiC纳米线可以在低至900℃的温度下生长在基板上。 XRD图谱表明SiC纳米线为立方碳化硅。 TEM分析表明,非晶碳层围绕着沉积的SiC纳米线,并且3C-SiC纳米线的生长方向[111]具有良好的结晶结构。 XPS和EDX分析表明,所获得的SiC纳米线具有约1.0:1.2的原子Si和C组成,这暗示了电子器件和场发射器的可能应用。

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