ACCELERATED RELIABILITY METHODOLOGIES FOR ELECTRONIC COMPONENTS A CASE STUDY

摘要

The procedures of estimating the time to failure from accelerated test data are reviewed in this study. An accelerated life test approach which provides the desired reliability results for a fiber optic sensor in shorter times than would be possible with a test performed under normal stress conditions is presented. Utilizing ReliaSoft ALTA software the statistical and life distribution that describe the time to failure of the sensor is determined and the desired reliability results are calculated using the level probability density function.