DETERMINATION OF IMPURITIES IN SILICON CARBIDE BY SLURRYINTRODUCTION AXIAL VIEWED INDUCTIVELY COUPLED PLASMAOPTICAL EMISSION SPECTROMETRY

著录项

• 来源
  《The 11th International Beijing Conference and Exhibition on Instrumental Analysis (BCEIA 2005): Conference Abstracts》|2005年|1-2|共2页
• 会议地点 Beijing(CN);Beijing(CN)
• 作者

  Zheng WANG; Zheming NI; Deren QIU; Guangyi TAO; Pengyuan YANG;

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• 作者单位

  Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China Department of Chemistry, Fudan University, Shanghai 200433, China;

  Research Center for Eco-Environmental Sciences, Academia Sinica, P.O. Box 2871, Beijing 100085, China;

  Department of Chemistry, Fudan University, Shanghai 200433, China;

  Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China;

  Department of Chemistry, Fudan University, Shanghai 200433, China;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类 化学;仪器、仪表;
• 关键词