首页> 外国专利> Method for Analyzing Zirconium Concentration in Ferro Silicon Alloys Using Inductively Coupled Plasma Emission Spectrometry

Method for Analyzing Zirconium Concentration in Ferro Silicon Alloys Using Inductively Coupled Plasma Emission Spectrometry

机译:电感耦合等离子体发射光谱法分析硅铁合金中锆含量的方法

摘要

The present invention relates to a method for analyzing zirconium (Zr) concentration in ferroalloy (Fe-Si) ferroalloy using ICP (Inductively Coupled Plasma Emission Spectroscopy).;According to the invention,;In analyzing zirconium concentration in ferroalloy ferrosilicon using ICP,;Weigh a certain amount of high-purity pure iron and high-purity silicon into a Teflon beaker with high heat and acid resistance, then add standard zirconium solution step by step,;Adding a mixed acid of nitric acid, hydrochloric acid and hydrofluoric acid to the beaker, followed by volatilizing hydrofluoric acid using perchloric acid, and then dissolving the zirconium precipitate with nitric acid solution to pretreat the sample.;Preparing a solution for a calibration curve using the pretreated sample using ICP,;Measuring the intensity according to the zirconium concentration of the solution for the calibration curve by an inductively coupled plasma emission spectrophotometer and preparing a standard calibration curve between the zirconium concentration and the intensity based on this;;Unknown ferrosilicon sample to be analyzed after the sample pretreatment step and measuring the zirconium strength in the solution using ICP, and;Obtaining a zirconium concentration corresponding to the measured intensity based on a standard calibration curve prepared in advance.;According to the present invention, zirconium concentration can be quantitated more accurately and quickly over a wider range than in conventional wet analysis.
机译:本发明涉及一种使用ICP(电感耦合等离子体发射光谱法)分析铁合金(Fe-Si)铁合金中的锆(Zr)浓度的方法;根据本发明,在使用ICP分析铁合金硅铁中的锆浓度时;将一定量的高纯度纯铁和高纯度硅称入高耐热性和耐酸性的特氟龙烧杯中,然后逐步添加标准锆溶液;向其中加入硝酸,盐酸和氢氟酸的混合酸。烧杯中,然后用高氯酸使氢氟酸挥发,然后用硝酸溶液溶解锆沉淀物以预处理样品;使用经预处理的样品使用ICP制备校准曲线的溶液;根据锆测量强度用电感耦合等离子体发射分光光度计测定溶液的浓度,以得到校正曲线并制备标准校正液基于此的锆浓度和强度之间的离子曲线;样品预处理步骤后要分析的未知硅铁样品,并使用ICP测量溶液中的锆强度;以及根据浓度获得对应于所测强度的锆浓度根据本发明,与常规湿法分析相比,可以在更宽的范围内更准确,更快速地定量锆浓度。

著录项

  • 公开/公告号KR19990051986A

    专利类型

  • 公开/公告日1999-07-05

    原文格式PDF

  • 申请/专利权人 이구택;

    申请/专利号KR19970071427

  • 发明设计人 이영희;

    申请日1997-12-20

  • 分类号G01N21/31;G01N33/20;

  • 国家 KR

  • 入库时间 2022-08-22 02:17:03

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