METHOD AND FOURIER TRANSFORM SPECTROMETER WITH DUAL BEAM INTERFEROMETER FOR SINGLE-SHOT-IMAGING FOURIER SPECTROSCOPY

摘要

Fourier transform spectrometer, FT spectrometer, comprising: a two-beam interferometer comprising: at least one beam splitter unit (622; 623; 624, 625, 626, 627; 636; 673, 674, 675) for splitting an incident light beam (EB) a spatially extended object, into a first partial beam (TB1) and a second partial beam (TB2); At least one first beam deflection unit (630; 641; 651; 661; 697) which is designed to deflect the first partial beam bundle (TB1) at least a first and a second time, the first beam deflection unit (630) being designed to also the second Deflecting partial beam bundles (TB2) at least a first and a second time; or the two-beam interferometer comprises a second beam deflection unit (642; 652; 662) which is designed to deflect the second partial beam bundle (TB2) at least a first and a second time, the beam splitter unit also being designed to deflect the first partial beam bundle (TB1 ) and to at least partially superimpose the second partial beam (TB2) spatially and the respective first and second deflection of the first partial beam (TB1) and the second partial beam (TB2) generates a lateral shear (s); At least one first image field discriminator unit (BFD1; 631; 645; 653; 656; 666; 677; 976) which is arranged such that the first partial beam bundle (TB1) is spatially selected after splitting and before the second deflection; at least one second image field discriminator unit (BFD2; 632; 646; 654; 657; 667; 678; 977) which is arranged such that the second partial beam bundle (TB2) is spatially selected after splitting and before the second deflection.