WORK DEVICE ANALYSIS SYSTEM AND WORK DEVICE ANALYSIS METHOD, AND DATA COLLECTION DEVICE

摘要

A work device analysis method that includes: acquiring work history information from a work device in which is installed a work unit that carries out work for producing an electronic circuit substrate (ST1); generating, from the acquired work history information, a first file that includes an operation event log of the work device, and a second file that includes a production log for the electronic circuit substrate (ST2-ST4); determining whether maintenance of a work unit is necessary from the first file (ST5); and estimating the condition of the work unit from the second file (ST6).