Terahert wave attenuation total reflection spectroscopy method, terahertz wave attenuation total reflection spectroscopy device and pressure application device

摘要

terahertz wave attenuation total reflection spectroscopy method, comprising: a first step of arranging a measurement target whose volume changes over a measurement period on a reflection surface; and a second step of collecting data comprising a plurality of detection results, each corresponding to a plurality of times separated from each other during the measurement period,by incident of a terahertz wave on the reflection surface from a side opposite the target and by detecting the terahertz wave reflected on the reflection surface during the measurement period. In the second step, a state is maintained during the measurement period in which a substantially constant pressure is exerted on the arranged on the reflection surface measuring object.