TERAHERTZ WAVE ATTENUATED TOTAL REFLECTION SPECTROSCOPIC METHOD, TERAHERTZ WAVE ATTENUATED TOTAL REFLECTION SPECTROSCOPIC DEVICE, AND PRESSURE APPLICATION DEVICE

摘要

A terahertz wave attenuated total reflection spectroscopic method, includes: a first step of disposing a measurement target of which a volume is changed during a measurement period on a reflection surface; and a second step of acquiring data including a plurality of detection results respectively corresponding to a plurality of times separated from each other during the measurement period by allowing a terahertz wave to be incident on the reflection surface from a side opposite to the measurement target and by detecting the terahertz wave reflected on the reflection surface, during the measurement period. In the second step, a state in which a substantially constant pressure is applied to the measurement target disposed on the reflection surface is maintained during the measurement period.