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Metamaterial radiation from attenuated total reflection at terahertz frequencies.

机译:来自太赫兹频率的衰减全反射的超材料辐射。

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摘要

The focus of this research was to explore the behavior of two-dimensional planar metamaterials or metafilms and understand the various excitation schemes for application of metafilms to Terahertz-Attenuated Total Reflection spectroscopy (THz-ATR). A standard THz time domain spectroscopy system based on photoconductive switches was modified to implement the ATR technique. Finite metamaterial arrays with varying singly- split ring resonator sizes were excited in the Kretschmann ATR configuration using finite sized terahertz beams. Numerical approaches using commercial software were looked into to explain the experimental observations. Various theoretical models were used to explain the observed phenomena. The ATR measurements showed an unexpected strengthening of the resonance when the metafilm sample was illuminated near the edge. This phenomenon referred to in this study as "the anomalous edge enhancement" was observed strongly in metafilms with closely spaced rings. A re-radiation signal was observed across the total internal reflection barrier where no signal is expected. It consisted of two peaks one at the fundamental metamaterial resonance and the second peak was due to the periodicity of the metafilm array. The anomalous behavior seen in the ATR measurements is attributed to the edge currents at the boundary of the metafilm array giving rise to this re-radiation signal. Results from analytic treatments based on Floquet method and method of moments were able to qualitatively model the measurements. The observed re-radiation signal is a potential loss mechanism that could impact observations from commonly used transmission measurements on metamaterials.
机译:这项研究的重点是探索二维平面超材料或超薄膜的行为,并了解将超薄膜应用于太赫兹增强全反射光谱(THz-ATR)的各种激发方案。修改了基于光电导开关的标准太赫兹时域光谱系统,以实现ATR技术。在Kretschmann ATR配置中,使用有限尺寸的太赫兹束激发了具有可变单裂环谐振器尺寸的有限超材料阵列。调查使用商业软件的数值方法来解释实验观察。使用各种理论模型来解释观察到的现象。当异质膜样品在边缘附近照射时,ATR测量显示出共振的意外增强。在本研究中被称为“异常边缘增强”的现象在具有紧密间隔的环的薄膜中被强烈观察到。在没有预期信号的情况下,在整个内部反射屏障上观察到了重辐射信号。它由两个峰组成,一个在基本的超材料共振处,另一个峰是由于超膜阵列的周期性而引起的。在ATR测量中看到的异常行为归因于在超薄膜阵列边界上的边缘电流,从而产生了这种再辐射信号。基于Floquet方法和矩量法的分析处理结果能够定性地对测量结果进行建模。观察到的再辐射信号是一种潜在的损耗机制,可能会影响对超常材料的常用透射测量结果。

著录项

  • 作者

    Ramani, Suchitra.;

  • 作者单位

    Oklahoma State University.;

  • 授予单位 Oklahoma State University.;
  • 学科 Engineering Electronics and Electrical.;Physics Optics.
  • 学位 Ph.D.
  • 年度 2013
  • 页码 209 p.
  • 总页数 209
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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