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Residual gas analyser and EUV lithography system with a residual gas analyser

机译:具有剩余气体分析仪的残余气体分析仪和EUV光刻系统

摘要

The invention relates to a residual gas analyzer (40) for the analysis of a residual gas (30),in particular a residual gas (30) in an EUV lithography system (1),Comprising: an inlet system (41) for the inlet of residual gas (30) from a vacuum environment (27a) into the residual gas analyser (40),and a mass analyser (43),comprising a detector (44) for the detection of ionized constituents (30a) of the residual gas (30). The residual gas analyser (40) comprises an ion transfer device (42) for transferring the ionized components (30a) of the residual gas (30) to the mass analyser (43),wherein the ion transfer device (42) comprises an ion filter device (45) which is designed for filtering at least one ionic component (30a) of the residual gas (30). The invention also relates to an EUV lithography system, in particular an EUV lithography system comprising: at least one residual gas analyzer (40),which is designed as described above for the analysis of a residual gas (30) in a vacuum environment (27a) of the EUV lithography system (1).
机译:本发明涉及一种用于分析残余气体(30)的残余气体分析仪(40),特别是EUV光刻系统(1)中的残留气体(30),包括:用于入口的入口系统(41)从真空环境(27A)中的残留气体(30)进入残留气体分析仪(40)和质量分析仪(43),其包括检测器(44),用于检测残留气体的电离成分(30A)( 30)。残留的气体分析仪(40)包括离子转移装置(42),用于将残留气体(30)的电离部件(30a)转移到质量分析仪(43),其中离子转移装置(42)包括离子过滤器设计用于过滤残留气体(30)的至少一个离子组分(30A)的装置(45)。本发明还涉及EUV光刻系统,特别涉及EUV光刻系统,包括:至少一种残留气体分析仪(40),其如上所述设计用于在真空环境中分析残留气体(30)(27A )EUV光刻系统(1)。

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