ACCELERATED SEGMENTATION FOR REVERSE ENGINEERING OF INTEGRATED CIRCUITS

摘要

Various embodiments of the present disclosure provide for accelerated segmentation for reverse engineering of integrated circuits. In one example, an embodiment provides for receiving an SEM image for an integrated circuit, performing filtering and binarization with respect to the SEM image, extracting information associated with filter sizes for the filtering, extracting signatures related to a distribution for background pixels and foreground pixels of the SEM image, extracting respective distance to mean signatures for the background pixels and the foreground pixels, and segmenting the SEM image based at least in part on the filter sizes and the respective distance to mean signatures to generate a segmented image for the integrated circuit.