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Electronic components and systems with integrated self-test functionality

机译:具有集成自检功能的电子元件和系统

摘要

The present invention provides a first integrated sub-circuit having a defined interface and a defined fixed-hardware functionality, signal-connecting the first sub-circuit through the interface to exchange signals with and optionally energize the first sub-circuit to an electronic component comprising a second reconfigurable integrated sub-circuit comprising: and one or more terminals electrically coupling the electronic component to a periphery thereof. The second sub-circuit is configured as an interface circuit between the one or more terminals and the first sub-circuit. The second sub-circuit is configured to apply one or more input signals to the first circuit and, in response to the one or more input signals, apply one or more output signals received via the interface from the first sub-circuit to match one or more predetermined test criteria. by evaluating, further configured as a reconfigurable integrated test unit for testing the hardware functionality of the first sub-circuit. The present invention also relates to a system comprising two different components according to various embodiments of the electronic component.
机译:本发明提供了一种具有限定接口的第一集成子电路和定义的固定硬件功能,通过接口信号连接第一子电路以将信号连接和可选地将第一子电路通电到包括的电子元件第二可重构集成子电路,包括:一个或多个终端电耦合到其周边。第二子电路被配置为在一个或多个端子和第一子电路之间的接口电路。第二子电路被配置为将一个或多个输入信号应用于第一电路,并且响应于一个或多个输入信号,通过从第一子电路从第一子电路施加经由接口接收的一个或多个输出信号以匹配一个或更预定的测试标准。通过评估,进一步配置为可重新配置的集成测试单元,用于测试第一子电路的硬件功能。本发明还涉及一种系统,该系统包括根据电子元件的各种实施例的两个不同的部件。

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