首页> 外国专利> METHOD OF THINNING A SEMICONDUCTOR SUBSTRATE TO HIGH EVENNESS AND SEMICONDUCTOR SUBSTRATE HAVING A DEVICE LAYER OF HIGH EVENNESS

METHOD OF THINNING A SEMICONDUCTOR SUBSTRATE TO HIGH EVENNESS AND SEMICONDUCTOR SUBSTRATE HAVING A DEVICE LAYER OF HIGH EVENNESS

机译:将半导体衬底缩小到高均匀度和半导体衬底的方法,具有高均匀度的器件层

摘要

A method of manufacturing a semiconductor device is described. The method includes providing a semiconductor substrate. The semiconductor substrate includes a high-doped semiconductor substrate layer, a high-doped semiconductor device layer, and a low-doped semiconductor etch stop layer arranged between the high-doped semiconductor substrate layer and the high-doped semiconductor device layer. The high-doped semiconductor substrate layer is removed, wherein the removing includes dopant selective chemical etching stopping at the low-doped semiconductor etch stop layer. Further, the low-doped semiconductor etch stop layer is thinned to generate an exposed surface of the high-doped semiconductor device layer.
机译:描述了一种制造半导体器件的方法。 该方法包括提供半导体衬底。 半导体衬底包括高掺杂的半导体衬底层,高掺杂的半导体器件层和布置在高掺杂半导体衬底层和高掺杂半导体器件层之间的低掺杂半导体蚀刻停止层。 除去高掺杂的半导体衬底层,其中除去包括在低掺杂半导体蚀刻停止层处停止的掺杂剂选择性化学蚀刻。 此外,薄掺杂的半导体蚀刻停止层变薄以产生高掺杂半导体器件层的暴露表面。

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