首页> 外国专利> GATE STRUCTURE OF A HALF-LIGHT BUILDING EMENT AND PROCEDURE FOR ITS OWN DEVELOPMENT

GATE STRUCTURE OF A HALF-LIGHT BUILDING EMENT AND PROCEDURE FOR ITS OWN DEVELOPMENT

机译:半光线建筑物的栅极结构和自身发展的过程

摘要

A semiconductor element and a process for forming it are provided. A process involves the formation of a Finnish that extends from a substrate. A victim-gate electrode layer is formed along a side wall and an upper surface of the Finns. A structuring process is performed on the victim-gate electrode layer to form a victim-gate electrode. A transformation process is performed on the victim gate electrode,to form a transformed victim-gate electrode. The transformed victim gate electrode has a first section along the Finnish surface and a second section along the Finnish side wall. A width of the first section decreases when the first section extends from an upper surface of the first section towards the upper surface of the fins. A width of the second section decreases when the second section extends from the surface of the fins towards the substrate.
机译:提供半导体元件和用于形成其的方法。 过程涉及形成从基材延伸的芬兰。 沿侧壁和鳍片的上表面形成受害栅电极层。 在受害栅电极层上执行结构化处理以形成受害栅电极。 在受害栅电极上执行变换过程,以形成变换的受害者栅电极。 变换的受害栅极具有沿芬兰表面的第一部分和沿芬兰侧壁的第二部分。 当第一部分从第一部分的上表面朝向翅片的上表面延伸时,第一部分的宽度减小。 当第二部分从翅片的表面朝向基板延伸时,第二部分的宽度减小。

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