首页> 外国专利> METHOD FOR CALIBRATING A DEVICE FOR MEASURING A PROCESS VALUE OF AT LEAST ONE SUBSTANCE, METHOD FOR MEASURING A PROCESS VALUE OF AT LEAST ONE SUBSTANCE BY MEANS OF A DEVICE AND SYSTEM

METHOD FOR CALIBRATING A DEVICE FOR MEASURING A PROCESS VALUE OF AT LEAST ONE SUBSTANCE, METHOD FOR MEASURING A PROCESS VALUE OF AT LEAST ONE SUBSTANCE BY MEANS OF A DEVICE AND SYSTEM

机译:用于校准用于测量至少一种物质的过程值的装置的方法,通过装置和系统测量至少一种物质的过程值的方法

摘要

A method for calibrating an apparatus includes, in the case of a known process value, measuring a detector value of a first type only based on captured gamma rays that are not scattered or are scattered little; calculating a calibration assignment based on a process model; in the case of at least one unknown process value, measuring a detector value of the first type and measuring a detector value of a second type at least based on captured gamma rays that are scattered; determining the unknown process value by using the calculated calibration assignment based on the measured detector value of the first type; and modifying the calibration assignment by assigning the measured detector value of the second type to the determined process value.
机译:用于校准设备的方法包括在已知处理值的情况下,仅基于不散射或分散的捕获的伽马光线测量第一类型的检测器值; 基于过程模型计算校准分配; 在至少一个未知过程值的情况下,测量第一类型的检测器值并至少基于散射的捕获的伽马射线测量第二类型的检测器值; 通过使用基于第一类型的测量检测器值使用计算的校准分配来确定未知的过程值; 通过将第二类型的测量检测器值分配给所确定的过程值来修改校准分配。

著录项

  • 公开/公告号EP3922961A4

    专利类型

  • 公开/公告日2021-12-15

    原文格式PDF

  • 申请/专利权人 BERTHOLD TECHNOLOGIES GMBH & CO. KG;

    申请/专利号EP20200179373

  • 发明设计人 MÜLLER DR. STEFFEN;

    申请日2020-06-10

  • 分类号G01F23/288;G01F25;G01N9/24;

  • 国家 EP

  • 入库时间 2024-06-14 22:31:53

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