METHOD FOR CALIBRATING A DEVICE FOR MEASURING A PROCESS VALUE OF AT LEAST ONE SUBSTANCE, METHOD FOR MEASURING A PROCESS VALUE OF AT LEAST ONE SUBSTANCE BY MEANS OF A DEVICE AND SYSTEM

摘要

The invention relates to a method for calibrating a device (1) for measuring a process value (PW) of at least one substance (ST), the device (1) having a detector device (2), the detector device (2) measuring a detector value (DW) by means of detecting at least gamma rays (GR), the gamma rays (GR) having at least partially penetrated at least the substance (ST) and thereby scattering, and generating the detector value (DW) based on the detected gamma rays (GR) is designed, - the method comprising the step of: calculating a calibration assignment (KT) at least by simulating the penetration and thereby modeling the scattering (SC) of the gamma rays (GR), the calibration assignment (KT) each having a detector value (DW) for different process values (PW) assigns.