首页> 外国专利> COMPLEX FOR TESTING RADIATION RESISTANCE OF ELECTRONIC COMPONENT BASE PRODUCTS IN HIGH-INTENSITY FIELDS OF BRAKING RADIATION

COMPLEX FOR TESTING RADIATION RESISTANCE OF ELECTRONIC COMPONENT BASE PRODUCTS IN HIGH-INTENSITY FIELDS OF BRAKING RADIATION

机译:用于在制动辐射的高强度场中测试电子元件基础产品的辐射阻力的复合物

摘要

FIELD: nuclear and radiation physics.;SUBSTANCE: invention relates to nuclear and radiation physics and can be used to test radiation resistance (RR) of promising electronic component base (ECB) products of various types. The result is achieved by localizing BR field in a closed test compartment to accommodate tested ECB products, providing collimated selective effects on ECB, protecting the tested ECB from radiation scattered in the hall, reducing to an acceptable level the dose loads on the equipment and connectors and recording equipment located near the target outside the test volume, protection against penetration of electromagnetic blast (EMB) from accelerator compartment. ;EFFECT: expansion of accelerator's capabilities from the point of view of testing modern ECB, possibility of selective exposure of braking radiation (BR) to individual ECB elements.;3 cl, 2 dwg
机译:现场:核和辐射物理学。物质:发明涉及核和辐射物理学,可用于测试各种类型的有前途电子元件基础(ECB)产品的辐射电阻(RR)。 结果是通过将BR场定位在闭合的测试室中以容纳测试的ECB产品,为ECB提供准直的选择性效果,保护测试的欧洲植检的辐射从霍尔散射,降低到设备和连接器上的剂量载荷的可接受水平 和记录设备位于目标外部的测试量外,防止电磁爆破(EMB)的渗透从加速器舱。 ;效果:从测试现代ECB的角度来看,扩大加速器的能力,使制动辐射(BR)对单独的ECB元素选择性暴露的可能性。; 3 CL,2 DWG

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