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Indium compound and method of forming an indium-containing film using the indium compound

机译:使用铟化合物形成含铟薄膜的铟化合物和方法

摘要

Provided are a method for forming an indium-containing film by an ALD method at a high temperature that allows the use of an indium compound without performing a special pretreatment and enables formation of a high-throughput indium-containing film, and an indium compound used in this method. A method of forming an indium-containing film according to the present invention comprises the steps of (a) placing a substrate in a chamber; (b) introducing a gas containing an indium compound represented by the following general formula (1); (c) a first purge process; (d) introducing an oxygen-containing gas; and (e) a second purge step, wherein steps (b) to (e) are repeated at a temperature of 225° C.-400° C. or less until a desired thickness of the indium-containing film is obtained. In(C 5 R 1x H (5-x) )...(1) (Here, in the general formula (1), x is an integer of 1-5, and R 1 is each independently a hydrocarbon group having 1-8 carbon atoms.)
机译:提供一种通过在高温下通过ALD方法形成含铟膜的方法,该方法允许使用铟化合物而不进行特殊预处理,并且能够形成含高通量的含铟膜,以及所用的铟化合物 在这种方法中。 根据本发明的形成含铟膜的方法包括(a)将基材放入腔室中的步骤; (b)引入含有下列通式(1)表示的铟化合物的气体; (c)第一次清洗过程; (d)引入含氧气体; (e)第二吹扫步骤,其中步骤(b)至(e)在225℃-400℃或更低的温度下重复,直到获得所需含铟薄膜的厚度。 在(C 5 R 1x H(5-x))中(1)(这里,在通式(1)中,X是1-5的整数,并且R 1各自独立地为具有1的烃基组 -8碳原子。)

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