首页> 外国专利> Non-volatile memory device including vertical pass transistors having a greater width in an area between a gate and a word line than a width of a channel structure in an area between a ground select line and the word line

Non-volatile memory device including vertical pass transistors having a greater width in an area between a gate and a word line than a width of a channel structure in an area between a ground select line and the word line

机译:非易失性存储器件,包括垂直通晶体管,在栅极和字线之间的区域中具有比地面选择线和字线之间的区域中的频道结构的宽度更大的宽度

摘要

A memory device including: a memory cell array disposed in a first semiconductor layer, the memory cell array including a plurality of wordlines extended in a first direction and stacked in a second direction substantially perpendicular to the first direction; and a plurality of pass transistors disposed in the first semiconductor layer, wherein a first pass transistor of the plurality of pass transistors is disposed between a first signal line of a plurality of signal lines and a first wordline of the plurality of wordlines, and wherein the plurality of signal lines are arranged at the same level as a common source line.
机译:存储装置包括:设置在第一半导体层中的存储单元阵列,存储单元阵列包括在第一方向上延伸的多个字线,并且在基本垂直于第一方向的第二方向上堆叠; 和设置在第一半导体层中的多个通晶晶体管,其中多个通过晶体管的第一通道晶体管设置在多条信号线的第一信号线和多个字线的第一字线之间,并且其中 多条信号线以与公共源极线相同的水平布置。

著录项

  • 公开/公告号US11189634B2

    专利类型

  • 公开/公告日2021-11-30

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号US201916705395

  • 发明设计人 KYUNGHWA YUN;CHANHO KIM;PANSUK KWAK;

    申请日2019-12-06

  • 分类号H01L27/11582;H01L23/528;H01L27/11573;H01L29/78;H01L29/10;G11C16/04;G11C16/14;G11C16/26;G11C16/10;G11C16/08;H01L27/11565;H01L23/532;

  • 国家 US

  • 入库时间 2022-08-24 22:13:10

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