首页>
外国专利>
DEFECT WEIGH FORMULAS FOR ANALOG DEFECT SIMULATION
DEFECT WEIGH FORMULAS FOR ANALOG DEFECT SIMULATION
展开▼
机译:模拟缺陷仿真的缺陷称重公式
展开▼
页面导航
摘要
著录项
相似文献
摘要
A method, apparatus, and/or computer program product can performing an analog defect simulation on an electronic device. The method, apparatus, and/or computer program product can generate a defect catalog which identifies a defect class relating to a defect and a modeling parameter that is associated with the defect class. The method, apparatus, and/or computer program product can receive a weight formula that identifies a weight for the defect class in relation to the modeling parameter. The method, apparatus, and/or computer program product can call a defect weight function to return the weight from the defect weight formula. The method, apparatus, and/or computer program product can perform the analog defect simulation on the electronic device. The method, apparatus, and/or computer program product can determine a simulation statistic relating to the analog defect simulation utilizing the weight.
展开▼