首页> 外国专利> SEMICONDUCTOR STRUCTURE HAVING BOTH ENHANCEMENT MODE GROUP III-N HIGH ELECTRON MOBILITY TRANSISTORS AND DEPLETION MODE GROUP III-N HIGH ELECTRON MOBILITY TRANSISTORS

SEMICONDUCTOR STRUCTURE HAVING BOTH ENHANCEMENT MODE GROUP III-N HIGH ELECTRON MOBILITY TRANSISTORS AND DEPLETION MODE GROUP III-N HIGH ELECTRON MOBILITY TRANSISTORS

机译:半导体结构具有增强模式III-N高电子迁移率晶体管和耗尽模式III-N高电子迁移率晶体管

摘要

An Enhancement-Mode HEMT having a gate electrode with a doped, Group III-N material disposed between an electrically conductive gate electrode contact and a gate region of the Enhancement-Mode HEMT, such doped, Group III-N layer increasing resistivity of the Group III-N material to deplete the 2DEG under the gate at zero bias.
机译:具有具有掺杂的栅电极的增强模式HEMT,设置在导电栅电极接触和增强型HEMT的栅极区域之间的III-N材料,这种掺杂的,III-N层的增加的电阻率 III-N材料在零偏压下耗尽栅极下的2个。

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