Temperature effect compensation in memory arrays

摘要

A memory system having a temperature effect compensation mechanism is provided. The memory system may include a plurality of memory cells, where the memory cells are organized in an array having two or more rows of memory cells arranged horizontally and two or more columns of memory cells arranged vertically. The plurality of memory cells may have an operating temperature range. The memory system may also include a temperature-dependent biasing circuit that is configured to reduce a biasing voltage to the plurality of memory cells when the temperature of the array is at or near an upper end of the operating temperature range and increase the biasing voltage to the plurality of memory cells when the temperature of the array is at or near a lower end of the operating temperature range.