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Fluorescent X-ray analysis apparatus and control method of X-ray fluorescence analyzer

机译:荧光X射线分析装置和X射线荧光分析仪的控制方法

摘要

Problem to be solved: to provide a fluorescence X-ray analysis apparatus capable of preventing deterioration or breakage of the sample and preventing contamination inside the apparatus even if an abnormal condition occurs in the X-ray fluorescence spectrometer, and a method of controlling the X-ray fluorescence analyzer.A moving mechanism for moving a sample between a standby position and a measurement positionAn X-ray source for irradiating a primary X-ray to the sampleDetector for measuring intensity of incident X-ray fluorescenceA first control unit for controlling the movement mechanism and the operation of the X-ray sourceMeasurement unit withAnalysis of the sample based on the intensity of said fluorescent X-ray measured by said detectorCommunicate with the first control sectionA second control section for controlling said measurement sectionInformation processing DepartmentAndThe first control unitWhen communication between the first control unit and the second control unit is interruptedFor the moving mechanismThere is a saving means for saving the sample at the measurement position in the standby position.Diagram
机译:要解决的问题:提供一种荧光X射线分析装置,其能够防止样品的劣化或破坏并防止装置内部的污染,即使在X射线荧光光谱仪中发生异常情况,以及控制x的方法-Ray荧光分析仪。用于在待机位置和测量位置之间移动样品的移动机构,用于照射到用于测量入射X射线荧光素膜的强度的用于控制运动的初始控制单元基于所述检测部分第二控制部分测量的基于所述荧光X射线的强度,基于通过所述检测部分第二控制部分测量的所述荧光X射线的强度,用于控制所述测量部分信息处理部门的通信的第一控制单元第一控制单元和第二控制单元是i移动机制是一种保存手段,用于在待机位置处的测量位置处保存样本.diagram

著录项

  • 公开/公告号JP6962613B1

    专利类型

  • 公开/公告日2021-11-05

    原文格式PDF

  • 申请/专利权人 株式会社リガク;

    申请/专利号JP20200103349

  • 发明设计人 山本 悦久;山田 康治郎;原 真也;

    申请日2020-06-15

  • 分类号G01N23/223;G01N23/2209;

  • 国家 JP

  • 入库时间 2022-08-24 22:07:40

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